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Electrical Properties of Semiconducting Copper Zinc Sulphide Thin Films

Electrical Properties of Semiconducting Copper Zinc Sulphide Thin Films

Original Research ArticleMay 19, 2021Vol. 22 No. 1 (2022) 10.55003/cast.2022.01.22.003

Abstract

The electrical properties of metal-organic-chemical-vapour-deposited copper zinc sulphide (Cu-Zn-S) thin films on soda-lime substrates were studied. The films produced were characterized in terms of their electrical properties employing the Four-point probe procedure at a temperature range of 370 to 470oC. The electrical properties (resistivity and conductivity) of the deposited copper zinc sulphide films were systematically studied in terms of the deposition parameters of concentration and deposition temperature. The conductivity was in the interval of 5.48 to 8.0 × 10-1 (Ω.cm)-1. Activation energies of 0.54 and 0.29 eV in the deposition temperature range were estimated. The high resistive property of the films re-emphasized the potential use of these materials as active semiconductors for optoelectronic device applications.

Keywords: copper zinc sulphide; electrical conductivity; thin films; thickness; four-point probes

*Corresponding author: Tel.: +234(0)8068930891

                                          E-mail: jjjemegha@yahoo.com

References

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2
Kitagawa, N., Ito, S., Nguyen, D. and Nishino, H., 2013. Copper zinc sulfur compound solar cells fabrication by spray pyrolysis deposition for solar cells. Natural Resources, (4),142-145.
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Emegha, J.O., Damisa, J., Efe, F.O., Olofinjana, B., Eleruja, M.A. and Azi, S.O., 2019. Preparation and characterization of metal organic chemical vapour deposited copper zinc sulphide thin films using single solid source precursors. European Journal of Materials Science and Engineering, 4(1), 11-22.
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Emegha, J.O., Okafor, C.M. and Ukhurebor, K.E., 2021. Optical properties of copper-zinc sulphide network from mixed single solid source precursors of copper and zinc dithiocarbamates. Walailak Journal of Science & Technology, 18(9), https://doi.org/10.48048/ wjst.2021.9535.
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Alkhayatt, A.H.O., Habieb, A.A.W., Al-Noaman, A.H.A. and Hameed, A.A., 2019. Structure, surface morphology optical properties of CuxZn1-xS/Au NPs layer for photo detector application. Journal of Physics: Conference Series, 1234, 012012, https://doi.org/ 10.1088/1742-6596/1234/1/012012.

Author Information

Marcus Adebola Eleruja

Department of Physics, Faculty of Physical Sciences, University of Benin, Edo State, Nigeria

Marcus Adebola Eleruja

Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria

Marcus Adebola Eleruja

Department of Physics, Faculty of Science, Edo State University Uzairue, Edo State, Nigeria

Marcus Adebola Eleruja

Department of Geosciences, University of Lagos, Lagos, Nigeria

Marcus Adebola Eleruja

Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria

About this Article

Current Journal

Vol. 22 No. 1 (2022)

Type of Manuscript

Original Research Article

Keywords

copper zinc sulphide;
electrical conductivity;
thin films;
thickness;
four-point probes

Published

19 May 2021

DOI

10.55003/cast.2022.01.22.003

Current Journal

Journal Cover
Vol. 22 No. 1 (2022)

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